Alan S. Kaufman, PhD
Dr. Alan S. Kaufman and Dr. Nadeen L. Kaufman have been at Yale University's Child Study Center in the School of Medicine since 1997, as Clinical Professor of Psychology and Lecturer on the clinical faculty, respectively. Together they combine expertise in psychometrics, test construction, and clinical assessment. A student of Robert L. Thorndike at Columbia University, Alan served a "clinical apprenticeship" with David Wechsler and Dorothea McCarthy while employed from 1968 to 1974 as assistant director of test research and supervisor of statistics in the test division of The Psychological Corporation. He helped develop the McCarthy Scales and Wechsler Intelligence Scale for Children-Revised (WISC-R) and supervised the standardization of both tests.
From 1974 to 1997, Alan and Nadeen trained school psychologists and clinical psychologists, and supervised graduate-student research, at the University of Georgia, the National College of Education in Evanston, Illinois, the California School of Professional Psychology, San Diego campus, and the University of Alabama. The research team that they supervised while at the University of Georgia in 1978-79 to develop the original Kaufman Assessment Battery for Children (K-ABC) included several individuals who went on to become international leaders in assessment.
In addition to the K-ABC and its second edition (KABC-II), both of which have been translated, adapted, and standardized in numerous countries around the world, Alan and Nadeen have developed a variety of other psychological and educational tests published by Pearson, including the Kaufman Test of Educational Achievement (K-TEA), the Kaufman Brief Intelligence Test (K-BIT), and the second editions of both (KTEA-II and KBIT-2). The Kaufman Survey of Early Academic and Language Skills (K-SEALS) and the Cognitive/Language Profile of the Early Screening Profiles address the preschool level. The Kaufman Adolescent and Adult Intelligence Test (KAIT), the Kaufman Short Neuropsychological Assessment Procedure (K-SNAP), and the Kaufman Functional Academic Skills Test (K-FAST) extend through the adult life span, as does the KBIT-2. They developed the computerized K-CLASSIC for French-speaking countries, which has been published for Germany-speaking countries as well. The K-BIT has been published in Spain and both the KAIT and K-SNAP have been published in Germany and Netherlands.
Alan, a co-editor of the journal Research in the Schools from 1992-2004, serves on the board of five professional journals and has published 24 books and more than 250 articles, reviews, and chapters in professional journals and books in the fields of school psychology, special education, clinical psychology, neuropsychology, and educational psychology. Among Alan's books are Intelligent Testing with the WISC-R (1979), Intelligent Testing with the WISC-III (1994), IQ Testing 101 (2009), Assessing Adolescent and Adult Intelligence (1990; 3rd ed. with Liz Lichtenberger, 2006), and several that he has co-authored for Wiley's Essentials of Assessment series, including Essentials of WAIS-III Assessment (with Liz Lichtenberger, 1999), Essentials of WPPSI-III Assessment (with Liz Lichtenberger, 2004), Essentials of WISC-IV Assessment (with Dawn Flanagan, 2004, 2009), and Essentials of WAIS-IV Assessment (with Liz Lichtenberger, 2009, 2013). Alan and Nadeen co-edit this series and are co-founding editors of two other Wiley series: Essentials of Mental Health Practice and Essentials of Behavioral Science.
Alan is a fellow of four divisions of the American Psychological Association (APA) and of the Association of Psychological Science (APS), and is a recipient of the Mensa Education and Research Foundation Award for Excellence (1989) and the Mid-South Educational Research Association Outstanding Research Award (1988 & 1993). In 1997, he was awarded APA's Senior Scientist Award from Division 16 (School Psychology); in 2011 he was given the Fordham University Graduate School of Education Excellence in Assessment Award (renamed the Alan S. Kaufman Intelligent Testing Award for future recipients); and in 2012 he was awarded APA Division 5’s prestigious Samuel J. Messick Award for Distinguished Scientific Contributions.